11th Dutch Testing Day

Info on last year's (2005) Testing Day is included below. If you are looking for the 12th Dutch Testing Day, to be held on November 16, 2006 at ASML, Veldhoven, then follow this link.

The 11th Dutch Testing Day has taken place on 11 November 2005, at the campus of the University of Twente (Amphitheatre in the Vrijhof building), organised by LaQuSo and University of Twente. By tradition, professionals from academia and industry met during this Testing Day to learn about new developments, latest tools and techniques and each other's knowledge and experience. The theme of last year's Dutch Testing Day was test automation.

Proceedings

You can download the cover of the booklet and the booklet of the 11th Dutch Testing Day.

The slides of several presentations are linked from the program, below.

Program

(all talks were in English)

10:00	registration and coffee
10:25	opening (Ed Brinksma)
10:30	Keynote speaker: Carsten Weise (Ericsson) Testing and Test Automation in Telecommunication
11:30	Session chair: Judi Romijn
	E. Altena (LogicaCMG) Using TTCN-3 to standardize the test automation chain (pps)
	N. Ioustinova et al. (CWI) TTCN-3 for Automated Testing Railway Control Systems
12:30	lunch
14:00	Session chair: Teade Punter
	E. Brandt (Refis) Defect registration as knowledge base
	H. van Gerwen (Ordina) Proving test coverage at requirements level
	P. Koopman (Radboud University) On-the-fly generation of test suites for automatic testing
15:30	coffee
16:00	Session chair: Henk van Dam
	G. van Leeuwen, H. van Loenhoud (INQA) Case study AllianzNet: Automated versus manual testing
	H. Bohnenkamp (RWTH Aachen), A. Belinfante (U. Twente) Timed Testing with TorX
	I. de Jong et al. (ASML) Test automation in the alpha test of wafer scanners
17:30	reception